Global Thin Film Metrology Systems Market 2014-2018

DUBLIN, Apr. 25, 2014 /PRNewswire/ -- Research and Markets (http://www.researchandmarkets.com/research/b29wtt/global_thin_film) has announced the addition of the "Global Thin Film Metrology Systems Market 2014-2018" report to their offering.

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One of the major trends emerging in the Global Thin Film Metrology Systems market is the increased R&D spending by the market vendors. Vendors such as Rudolph, KLA-Tencor, Nanometrics, and Nova Measuring Instruments have already invested a considerable amount of time and money in their R&D departments for the expansion of their product portfolios.

They are also increasingly investing in their R&D divisions to provide enhanced functionality and to meet the unsatisfied requirements of end-consumers. The R&D investments have enabled them to capture a significant market share and gain a competitive edge over the other vendors in the market.

According to the report, the high demand for thin film metrology systems for the development of flat panel displays is an important driver. These systems are used for measuring the thin films used in the flat panel displays of portable mobile devices such as smartphones, tablets, and e-readers.

Further, the report states that one of the key challenges in this market is the cyclical nature of the Semiconductor industry. The Semiconductor industry is one of the major end-users of thin film metrology systems, and any fluctuations in this industry inevitably leads to fluctuations in the Global Thin Film Metrology Systems market.

The study was conducted using an objective combination of primary and secondary information including inputs from key participants in the industry. The report contains a comprehensive market and vendor landscape in addition to a SWOT analysis of the key vendors.

Key Topics Covered:

01. Executive Summary

02. List of Abbreviations

03. Scope of the Report

04. Market Research Methodology

05. Introduction

06. Market Landscape

07. Geographical Segmentation

08. Key Leading Countries

09. Buying Criteria

10. Market Growth Drivers

11. Drivers and their Impact

12. Market Challenges

13. Impact of Drivers and Challenges

14. Market Trends

15. Trends and their Impact

16. Vendor Landscape

17. Key Vendor Analysis

18. Other Reports in this Series

Companies Mentioned:

Nanometrics Inc. Nova Measuring Instruments KLA-Tencor Corp. Rudolph Technologies Inc. For more information visit http://www.researchandmarkets.com/research/b29wtt/global_thin_film

Media Contact: Laura Wood, +353-1-481-1716, press@researchandmarkets.net

SOURCE Research and Markets

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